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Variability aware performance evaluation of nanoscale CMOS devices and circuits (R)

by Mande, Sudhakar S [Author] | Chandorkar, A.N [Supervisor] | Sharma, D.K [Supervisor].

Language: English Publication details: Mumbai IIT 2011Availability: Items available for reference: Not for loan (1) Call number: 043:621.372:621.382 Man.

Computer aided simulation of MOS device degradation (R)

by Subbaraman, Shaila [Author] | Sharma, D.K [Supervisor] | Indian Institute of Technology Bombay. Department of Electrical Engineering.

Language: English Publication details: Mumbai IIT 1998Dissertation note: Thesis Ph.D. Indian Institute of Technology Bombay. Department of Electrical Engineering 1998 Availability: Items available for reference: Not for loan (1) Call number: 043:621.382:620.1:681.3 Sub.

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