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Computer aided simulation of MOS device degradation (R)

By: Subbaraman, Shaila [Author]Contributor(s): Sharma, D.K [Supervisor] | Indian Institute of Technology Bombay. Department of Electrical Engineering Language: English Publication details: Mumbai IIT 1998Description: xiii,175 p. 28 cmSubject(s): Theses and Dissertations | Metal oxide semiconductors -- Computer simulationDissertation note: Thesis Ph.D. Indian Institute of Technology Bombay. Department of Electrical Engineering 1998

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Holdings
Item type	Current library	Call number	Status	Notes	Date due	Barcode	Item holds
Theses and Dissertations	Central Library, IITB Pamphlet Section (Theses, Standards, Reports)	043:621.382:620.1:681.3 Sub	Not for loan	D08A25		186863

Total holds: 0

Thesis
Ph.D.
Indian Institute of Technology Bombay. Department of Electrical Engineering 1998

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