Search

Your search returned 5 results.

Results
		No cover image available X-ray spectrochemical analysis by Birks, L.S \| . Series: Edition: Language: English Publication details: New York ; Interscience Pub., ; 1959Availability: Items available for loan: 4 Call number: 543.422 Bir(4), ... Place hold Add to cart (remove)
		No cover image available X-ray and electron methods of analysis / edited by H. Van Olphen and William Parrish by \| . Series: NASA TM - 85973 : 1984Edition: Language: English Publication details: New York ; Plenum Press, ; 1968Availability: Items available for loan: 1 Call number: 543:058 X-r. Place hold Add to cart (remove)
		No cover image available X-ray and electron probe analysis in biomedical research / edited by K.M. Earle and A.J. Tousimis by \| . Series: IEEE S 420 : 1982Edition: Language: English Publication details: New York ; Plenum Press, ; 1969Availability: Items available for loan: 1 Call number: 543:058 X-r(2). Place hold Add to cart (remove)
		No cover image available Quantitative determination of phase content of silicon nitride by x-ray diffraction analysis by Gazzara, Charles P \| Messier, Donald R \| . Series: Edition: Language: English Publication details: Massachusetts ; AMMRC, ; 1975Availability: Items available for loan: 1 Call number: 546.28:548.73 Gaz. Place hold Add to cart (remove)
		No cover image available Effect of jahn-teller ion on ht magnetic and optical properties of some spinel ferrites (R) by Srinivasan, T.T \| Srinivasan, C. Series: Edition: Language: English Publication details: Bombay ; IIT ; 1983Availability: Items available for reference: Not for loan (1) Call number: 043:539.2:549.73Sri. Add to cart (remove)

Powered by Koha