Quantitative determination of phase content of silicon nitride by x-ray diffraction analysis
Language: English Series: Publication details: Massachusetts ; AMMRC, ; 1975Edition: Description: 14 p; 27 cmISBN: 0Subject(s): | Silicon nitride | X-ray analysis| Item type | Current library | Call number | Status | Notes | Date due | Barcode | Item holds |
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Books
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Central Library, IITB | 546.28:548.73 Gaz | Available | G24A34 | 95836 |
Total holds: 0
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