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Neutron transmutation doping in semiconductors / edited by Jon M. Meese

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Series: Edition: Language: English Publication details: New York ; Plenum Press, ; 1979Availability: Items available for loan: 1 Call number: 621.382 Neu:2:78.

Impurity diffusion and gettering in silicon : symposium, Boston, Nov. 27-30, 1984 / edited by R.B. Fair, Charles W. Pearce and Jack Washburn

by | .

Series: Edition: Language: English Publication details: Pittsburgh ; Materials Research Society, ; 1985Availability: Items available for loan: 1 Call number: 537.311.33:548.526 Imp:84.

ICDS-16 : proceedings of the 16th international conference on defects in semiconductors, Bethlehem, Pennsylvania, 22-26 July, 1991 / edited by Gordon Davies, Gary G. DeLeo and Michael Stavola

by International conference on defects in semiconductors (16th | .

Series: Edition: Language: English Publication details: ; Zurich : Trans Tech Pub., 1992 ; 1992Availability: Items available for loan: 3 Call number: 537.311.33:548.4 Int:17:91-2, ...

ICDS-17 : proceedings of the 17th international conference on defects in semiconductors, Gmunden, Austria, July 18-23, 1993 / edited by Helmut Heinrich and Wolfgang Jantsch

by International conference on defects in semiconductors (17th | .

Series: Edition: Language: English Publication details: ; Aedermannsdorf : Trans Tech Pub., 1994 ; 1994Availability: Items available for loan: 3 Call number: 537.311.33:548.4 Int:17:93-3, ...

ICDS-18 : proceedings of the 18th international conference on defects in semiconductors, Sendai, Japan, July 23-28, 1995 / edited by Masashi Suezawa and Hiroshi Katayama-Yoshida

by International conference on defects in semiconductors (18th | .

Series: Edition: Language: English Publication details: ; Zurich-Uetikon : Trans Tech Pub., 1995 ; 1995Availability: Items available for loan: 3 Call number: 537.311.33:548.4 Int:18:95-3, ...

ICDS-18 : proceedings of the 18th international conference on defects in semiconductors, Sendai, Japan, July 23-28, 1995 / edited by Masashi Suezawa and Hiroshi Katayama-Yoshida

by International conference on defects in semiconductors (18th | .

Series: Edition: Language: English Publication details: ; Zurich-Uetikon : Trans Tech Pub., 1995 ; 1995Availability: Items available for loan: 1 Call number: 537.311.33:548.4 Int:18:95-2.

Rapid thermal processing symposium, Boston, Massachusetts, Dec. 2-4, 1985

by | Sedgwick, Thomas O. T | Sedgwick, Thomas O. T.

Series: Edition: Language: English Publication details: Pittsburgh ; MRS ; 1986Availability: Items available for loan: 1 Call number: 621.382:536.5Rap:85.

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