ICDS-18 : proceedings of the 18th international conference on defects in semiconductors, Sendai, Japan, July 23-28, 1995 / edited by Masashi Suezawa and Hiroshi Katayama-Yoshida
Language: English Series: Publication details: ; Zurich-Uetikon : Trans Tech Pub., 1995 ; 1995Edition: Description: pt.4; 24.5 cmISBN: 0-87849-715-31Subject(s): | Semiconductors-Defects-Congresses | Semiconductors-Impurity distribution-Congresses | Semiconductor doping-Congresses| Item type | Current library | Call number | Status | Notes | Date due | Barcode | Item holds |
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Books
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Central Library, IITB | 537.311.33:548.4 Int:18:95-3 | Available | G19B38 | 177860 | ||
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Books
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Central Library, IITB | 537.311.33:548.4 Int:18:9-4 | Available | G19B39 | 177861 | ||
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Books
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Central Library, IITB | 537.311.33:548.4 Int:18:95-1 | Available | G19B39 | 177608 |
Total holds: 0
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