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		No cover image available Quantitative electron microprobe analysis by Theisen, Roger \| . Series: Springer series in statisticsEdition: Language: English Publication details: Berlin ; Springer ; 1965Availability: Items available for loan: 1 Call number: 545.82The. Place hold Add to cart (remove)
		No cover image available Energy dispersion x-ray analysis : x-ray and electron probe analysis : a symposium : 73rd annual meeting, Toronto, Ont., Canada, 21-26 June, 1970 by American Society for Testing and Materials \| . Series: BSI 2690 : part - 117 : 1983Edition: Language: English Publication details: Philadelphia ; ASTM, ; 1971Availability: Items available for loan: 1 Call number: 620.1:061.2 Ame:73:70. Place hold Add to cart (remove)
		No cover image available Electron microprobe analysis and scanning electron microscopy in geology by Reed, S.J.B \| . Series: Edition: Language: English Publication details: ; Cambridge : Cambridge Univ. Press, 1996 ; 1996Availability: Items available for loan: 1 Call number: 55:537.533 Ree. Place hold Add to cart (remove)
		No cover image available Electron probe microanalysis by Birks, L.S \| . Series: NASA CP 3961 : 1986Edition: 2nd ed Language: English Publication details: New York ; Wiley-Interscience, ; 1971Availability: Items available for loan: 1 Call number: 543.4 Bir(2). Place hold Add to cart (remove)
		No cover image available Electron probe microanalysis by Birks, L.S \| . Series: NASA CP 3961 : 1986Edition: Language: English Publication details: New York ; Interscience Pub., ; 1963Availability: Items available for loan: 1 Call number: 543.4 Bir. Place hold Add to cart (remove)

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