Energy dispersion x-ray analysis : x-ray and electron probe analysis : a symposium : 73rd annual meeting, Toronto, Ont., Canada, 21-26 June, 1970

By: American Society for Testing and MaterialsContributor(s): Language: English Series: BSI 2690 : part - 117 : 1983Publication details: Philadelphia ; ASTM, ; 1971Edition: Description: 285 p; 24 cmISBN: 0-8031-0070-13Subject(s): | Electron probe microanalysis-Congresses | X-ray spectroscopy-Congresses
Star ratings
    Average rating: 0.0 (0 votes)
Holdings
Item type Current library Call number Status Notes Date due Barcode Item holds
Books Books Central Library, IITB
620.1:061.2 Ame:73:70 Available C11B12 62163
Total holds: 0

There are no comments on this title.

to post a comment.
Share

Powered by Koha