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		No cover image available Ion implantation in semiconductors : silicon and germanium by Mayer, James W \| Eriksson, Lennart \| Davies, John A \| . Series: Edition: Language: English Publication details: New York ; Academic Press, ; 1970Availability: Items available for loan: 1 Call number: 537.311.3 May(2). Place hold Add to cart (remove)
		No cover image available Electronic materials science : for integrated circuits in Si and GaAs by Mayer, James W \| Lau, S.S \| . Series: Edition: Language: English Publication details: New York ; Macmillan Pub., ; 1990Availability: Items available for loan: 1 Call number: 621.372:621.382 May. Place hold Add to cart (remove)
		No cover image available Backscattering spectrometry by Chu, Wei-Kan \| Mayer, James W \| Nicolet, Marc-A \| . Series: Edition: Language: English Publication details: New York ; Academic Press, ; 1978Availability: Items available for loan: 1 Call number: 535.33:539.17 Chu. Place hold Add to cart (remove)
		Fundamentals of nanoscale film analysis by Alford, Terry L \| Feldman, Leonard C \| Mayer, James W \| . Series: Edition: Language: English Publication details: New York ; Springer ; 2007Availability: Items available for loan: 1 Call number: 539.23Alf. Place hold Add to cart (remove)

		No cover image available Ion implantation in semiconductors : silicon and germanium by Mayer, James W \| Eriksson, Lennart \| Davies, John A \| . Series: Edition: Language: English Publication details: New York ; Academic Press, ; 1970Availability: Items available for loan: 1 Call number: 537.311.3 May(2). Place hold Add to cart (remove)
		No cover image available Electronic materials science : for integrated circuits in Si and GaAs by Mayer, James W \| Lau, S.S \| . Series: Edition: Language: English Publication details: New York ; Macmillan Pub., ; 1990Availability: Items available for loan: 1 Call number: 621.372:621.382 May. Place hold Add to cart (remove)
		No cover image available Backscattering spectrometry by Chu, Wei-Kan \| Mayer, James W \| Nicolet, Marc-A \| . Series: Edition: Language: English Publication details: New York ; Academic Press, ; 1978Availability: Items available for loan: 1 Call number: 535.33:539.17 Chu. Place hold Add to cart (remove)
		Fundamentals of nanoscale film analysis by Alford, Terry L \| Feldman, Leonard C \| Mayer, James W \| . Series: Edition: Language: English Publication details: New York ; Springer ; 2007Availability: Items available for loan: 1 Call number: 539.23Alf. Place hold Add to cart (remove)

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