Fundamentals of nanoscale film analysis

By: Alford, Terry LContributor(s): Feldman, Leonard C | Mayer, James W | Language: English Series: Publication details: New York ; Springer ; 2007Edition: Description: xiv,336 p; 24 cmISBN: 978-0-387-29260-1Subject(s): | Physics | Thin films , Nanomaterials , Thin films analysis
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Item type Current library Call number Status Notes Date due Barcode Item holds
Books Books Central Library, IITB
539.23Alf Available G21B12 220363
Total holds: 0

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