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CMOS reliability in advanced technology nodes : device to circuit interaction (R)

by Mishra, Subrat [Author] | Mahapatra, Souvik [Supervisor] | Indian Institute of Technology Bombay. Department of Electrical Engineering.

Material type: Text Text; Format: print ; Literary form: Not fiction Language: English Publication details: Mumbai IIT 2018Dissertation note: Thesis Ph.D. Indian Institute of Technology Bombay. Department of Electrical Engineering 2018 Availability: Items available for reference: Not for loan (1) Call number: 043:621.382 Mis.

Transition metal dichalcogenides for logic and memory applications (R)

by Kaushik, Naveen [Author] | Lodha, Saurabh [Supervisor] | Indian Institute of Technology Bombay. Department of Electrical Engineering.

Material type: Text Text; Format: print ; Literary form: Not fiction Language: English Publication details: Mumbai IIT 2018Dissertation note: Thesis Ph.D. Indian Institute of Technology Bombay. Department of Electrical Engineering 2018 Availability: Items available for reference: Not for loan (1) Call number: 043:621.382.3 Kau.

Physics, characterization, and modeling of negative bias temperature instability in advanced nanoscale transistors (R)

by Parihar, Narendra [Author] | Mahapatra, Souvik [Supervisor] | Indian Institute of Technology Bombay. Department of Electrical Engineering.

Material type: Text Text; Format: print ; Literary form: Not fiction Language: English Publication details: Mumbai IIT 2018Dissertation note: Thesis Ph.D. Indian Institute of Technology Bombay. Department of Electrical Engineering 2018 Availability: Items available for reference: Not for loan (1) Call number: 043:621.382.3 Par.

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