Test access port and boundary scan architecture

By: Maunder, Colin MContributor(s): Tulloss, Rodham E | Language: English Series: Publication details: Washington ; IEEE Computer Society Press, ; 1990Edition: Description: xxii,372 p; 27.5 cmISBN: 0-8186-9070-47Subject(s): | Electronic circuits - Testing- Data processing | Computer architecture
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Holdings
Item type Current library Call number Status Notes Date due Barcode Item holds
Books Books Central Library, IITB
621.372:621.382 Mau Available G36A02 158747
Total holds: 0

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