Test access port and boundary scan architecture
Maunder, Colin M.
Test access port and boundary scan architecture - - Washington IEEE Computer Society Press, 1990 - xxii,372 p. 27.5 cm - .
0-8186-9070-47
Electronic circuits - Testing- Data processing
Computer architecture
621.372:621.382 Mau
Test access port and boundary scan architecture - - Washington IEEE Computer Society Press, 1990 - xxii,372 p. 27.5 cm - .
0-8186-9070-47
Electronic circuits - Testing- Data processing
Computer architecture
621.372:621.382 Mau