Aggressive memory testing (R)

By: Reddy, K. ShailenderContributor(s): Chandorkar, A.N. and Parekhji, R.ALanguage: English Series: Publication details: Mumbai ; IIT ; 2008Edition: Description: vii,79 p; 30 cmISBN: Subject(s): Chandorkar, A.N. and Parekhji, R.A | Theses and Dissertations | Semiconductors-Reliability , Semiconductors-Testing , Algorithms
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Holdings
Item type Current library Call number Status Notes Date due Barcode Item holds
Theses and Dissertations Theses and Dissertations Central Library, IITB
043:621.382:519.3Red Not for loan D03B26 219947
Total holds: 0

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