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Aggressive memory testing (R)

Reddy, K. Shailender

Aggressive memory testing (R) - - Mumbai IIT 2008 - vii,79 p. 30 cm - .

ISBN:

Subjects--Topical Terms:
Chandorkar, A.N. and Parekhji, R.A.
Theses and Dissertations
Semiconductors-Reliability , Semiconductors-Testing , Algorithms

Universal Decimal Class. No.: 043:621.382:519.3Red

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