Advances in x-ray analysis : proceedings of the twenty-first annual conference on applications of x-ray analysis held august 2-4, 1972 (R)
Language: English Series: Publication details: New York ; Plenum Press ; 1973Edition: Description: v.16; 23 cmISBN: Subject(s): | X-rays-Industrial applications-CongressesItem type | Current library | Call number | Status | Notes | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|
Reference Books | Central Library, IITB | 548.73(058)Adv-16 | Available | C23A23 | 71954 |
Total holds: 0
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