Normal view MARC view ISBD view

Advances in x-ray analysis : proceedings of the twenty-first annual conference on applications of x-ray analysis held august 2-4, 1972 (R)

Advances in x-ray analysis : proceedings of the twenty-first annual conference on applications of x-ray analysis held august 2-4, 1972 (R) - - New York Plenum Press 1973 - v.16 23 cm. - .

ISBN:

Subjects--Topical Terms:

X-rays-Industrial applications-Congresses

Universal Decimal Class. No.: 548.73(058)Adv-16

Print
Add to your cart (remove)
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)