Scanning electron microscopy and x-ray microanalysis
Language: English Publication details: New York Springer 2017Description: xxiii,550 p. 29 cmISBN: 978-1-4939-6674-5Subject(s): Materials Science | Measurement | Microscopy | Physical measurements | Spectroscopy | Biological MicroscopyItem type | Current library | Call number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|
Books | Central Library, IITB General Stacks | 620.186/.187 Sca | Available | 250880 |
Total holds: 0
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