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Scanning electron microscopy and x-ray microanalysis

Scanning electron microscopy and x-ray microanalysis - New York Springer 2017 - xxiii,550 p. 29 cm

ISBN: 978-1-4939-6674-5

Subjects--Topical Terms:
Materials Science
Measurement
Microscopy
Physical measurements
Spectroscopy
Biological Microscopy

Universal Decimal Class. No.: 620.186/.187 / Sca

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