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Reliability studies in SONOS flash EEPROMs (R)

By: Bharath Kumar P [Author]Contributor(s): Mahapatra, S [Supervisor] | Indian Institute of Technology Bombay Department of Electrical Engineering Language: English Publication details: Bombay IIT 2006Description: xv,120 p; 30 cmSubject(s): Mahapatra, S | Theses and Dissertations | Semiconductor storage devices-Reliability | Silicon nitrideDissertation note: Thesis Ph.D Indian Institute of Technology Bombay. Department of Electrical Engineering 2006

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Holdings
Item type	Current library	Call number	Status	Notes	Date due	Barcode	Item holds
Theses and Dissertations	Central Library, IITB Pamphlet Section (Theses, Standards, Reports)	043:621.382:669.782 Bha	Not for loan	D08A26		212338

Total holds: 0

Thesis Ph.D Indian Institute of Technology Bombay. Department of Electrical Engineering 2006

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