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Reliability studies in SONOS flash EEPROMs (R)

Bharath Kumar P.

Reliability studies in SONOS flash EEPROMs (R) - Bombay IIT 2006 - xv,120 p. 30 cm

Thesis

Subjects--Topical Terms:
Mahapatra, S.
Theses and Dissertations
Semiconductor storage devices-Reliability
Silicon nitride

Universal Decimal Class. No.: 043:621.382:669.782 / Bha

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