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Investigations on temperature distribution, stresses, and redistribution in silicon wafers during processing (R)

By: Das, J.K [Author]Contributor(s): Mahapatra, S [Supervisor] | Indian Institute of Technology Bombay. Department of Electrical Engineering Language: English Publication details: Bombay IIT 1983Description: xvi, 338 p. 28 cmSubject(s): Silicon DevicesDissertation note: Thesis Ph.D. Indian Institute of Technology Bombay. Department of Electrical Engineering 1984

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Holdings
Item type	Current library	Call number	Status	Notes	Date due	Barcode	Item holds
Theses and Dissertations	Central Library, IITB Pamphlet Section (Theses, Standards, Reports)	043:621.382b Das	Not for loan	D08A21		125937

Total holds: 0

Thesis Ph.D. Indian Institute of Technology Bombay. Department of Electrical Engineering 1984

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