Physics, characterization, and modeling of negative bias temperature instability in advanced nanoscale transistors (R)
Material type: TextLanguage: English Publication details: Mumbai IIT 2018Description: xl,343 p. 30 cmSubject(s): Theses and Dissertations | Metal oxide semiconductors | Metal oxide semiconductor field-effect transistors | Transistor circuits | Integrated circuitsDissertation note: Thesis Ph.D. Indian Institute of Technology Bombay. Department of Electrical Engineering 2018Item type | Current library | Call number | Status | Notes | Date due | Barcode | Item holds |
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Theses and Dissertations | Central Library, IITB Pamphlet Section (Theses, Standards, Reports) | 043:621.382.3 Par | Not for loan | D03A24 | 243828 |
Total holds: 0
Thesis Ph.D. Indian Institute of Technology Bombay. Department of Electrical Engineering 2018
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