Physics, characterization, and modeling of negative bias temperature instability in advanced nanoscale transistors (R)
Parihar, Narendra
Physics, characterization, and modeling of negative bias temperature instability in advanced nanoscale transistors (R) - Mumbai IIT 2018 - xl,343 p. 30 cm
Thesis
Theses and Dissertations
Metal oxide semiconductors
Metal oxide semiconductor field-effect transistors
Transistor circuits
Integrated circuits
043:621.382.3 / Par
Physics, characterization, and modeling of negative bias temperature instability in advanced nanoscale transistors (R) - Mumbai IIT 2018 - xl,343 p. 30 cm
Thesis
Theses and Dissertations
Metal oxide semiconductors
Metal oxide semiconductor field-effect transistors
Transistor circuits
Integrated circuits
043:621.382.3 / Par