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		No cover image available Development of reliability based maintenance system (R) by Rao, Y. Srinivasa \| Srividya, A. and Verma, A.K. Series: Edition: Language: English Publication details: Bombay ; IIT ; 1996Availability: Items available for reference: Not for loan (1) Call number: 043:658.58:681.3Rao. Add to cart (remove)
		No cover image available Reliability and performance studies on PARAM 10000 parallel processing system with implementation of checkpointing and rollback recovery (R) by Belgi, Subodh S \| Verma, A.K. Series: Edition: Language: English Publication details: Mumbai ; IIT ; 1999Availability: Items available for reference: Not for loan (1) Call number: 043:658.562:681.327.8Bel. Add to cart (remove)
		No cover image available Reliability and performance evaluation of software on parallel computing systems (R) by Satpute, Aashish D \| Verma, A.K. Series: Edition: Language: English Publication details: Mumbai ; IIT ; 1998Availability: Items available for reference: Not for loan (1) Call number: 043:658.562:681.3.06Sat. Add to cart (remove)
		No cover image available Studies on condition monitoring of motor operated valves and development of fuzzy model for fault diagnostics and life estimation (R) by Chowdhury, Lekha \| Verma, A.K. and Venkat-Raj, V. Series: Edition: Language: English Publication details: Mumbai ; IIT ; 1998Availability: Items available for reference: Not for loan (1) Call number: 043:658.562:621.039Cho. Add to cart (remove)
		No cover image available Use of wavelet transforms in condition monitoring (R) by Pande, Vibhas \| Verma, A.K. Series: Edition: Language: English Publication details: Mumbai ; IIT ; 1999Availability: Items available for reference: Not for loan (1) Call number: 043:656.562:621.8:517.512.2Pan. Add to cart (remove)
		No cover image available RCM based condition monitoring (R) by Ghosh, Amit \| Verma, A.K. Series: Edition: Language: English Publication details: Mumbai ; IIT ; 1999Availability: Items available for reference: Not for loan (1) Call number: 043:658.562:621.8Gho. Add to cart (remove)
		No cover image available Reliability and yield estimation in circuit design (R) by Savant, S.V \| Verma, A. K. Series: Edition: Language: English Publication details: Mumbai ; IIT ; 2002Availability: Items available for reference: Not for loan (1) Call number: 043:658.562:621.372Sav. Add to cart (remove)

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