Reliability and yield estimation in circuit design (R)

By: Savant, S.VContributor(s): Verma, A. KLanguage: English Series: Publication details: Mumbai ; IIT ; 2002Edition: Description: iv,52 p; 30 cmISBN: Subject(s): Verma, A. K | Theses and Dissertations | Integrated circuits-Reliability
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Holdings
Item type Current library Call number Status Notes Date due Barcode Item holds
Theses and Dissertations Theses and Dissertations Central Library, IITB
043:658.562:621.372Sav Not for loan D06B20 196088
Total holds: 0

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