Metal work-function induced threshold voltage variability in multi-gate transistors (R) by Penugonda, Harsha Vardhan [Author] | Ganguly, Udayan [Supervisor] | Ganguly, Swaroop [Supervisor] | Indian Institute of Technology Bombay. Department of Electrical Engineering.
Material type: Text; Format:
print
; Literary form:
Not fiction
Language: English Publication details: Mumbai IIT 2019Dissertation note: Thesis Ph.D Indian Institute of Technology Bombay. Department of Electrical Engineering 2019 Availability: Items available for reference: Not for loan (1) Call number: 621.382.3 Pen.