ITC : international test conference : three faces of test : design,characterrization, production : proceedings, Philadelphia, Oct. 16-18, 1984
Institute of Electrical and Electronics Engineers
ITC : international test conference : three faces of test : design,characterrization, production : proceedings, Philadelphia, Oct. 16-18, 1984 - - New York IEEE, 1984 - xxxi,886 p. 28 cm - .
0-8186-0548-00
Electronic-Testing-Congresses
621.372:621.382 Ins:84
ITC : international test conference : three faces of test : design,characterrization, production : proceedings, Philadelphia, Oct. 16-18, 1984 - - New York IEEE, 1984 - xxxi,886 p. 28 cm - .
0-8186-0548-00
Electronic-Testing-Congresses
621.372:621.382 Ins:84