Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM

By: Egerton, Ray F [Author]Language: English Publication details: New York Springer 2005Description: xii,202 p. 24 cmISBN: 978-0-387-25800-3Subject(s): Materials science | Microscopy | Electron microscopy | Nanotechnology | Spectroscopy
List(s) this item appears in: New Arrivals : Display Books List from 19/02/2024-25/02/2024
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Item type Current library Call number Status Date due Barcode Item holds
Books Books Central Library, IITB
General Stacks 		620.186/.187 Ege Available 250882
Total holds: 0

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