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Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM

Egerton, Ray F

Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM - New York Springer 2005 - xii,202 p. 24 cm

ISBN: 978-0-387-25800-3

Subjects--Topical Terms:
Materials science
Microscopy
Electron microscopy
Nanotechnology
Spectroscopy

Universal Decimal Class. No.: 620.186/.187 / Ege

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