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Scanning electron microscopy and x-ray microanalysis

Contributor(s): Goldstein, Joseph I... [et al.] [Author]Language: English Publication details: New York Springer 2017Description: xxiii,550 p. 29 cmISBN: 978-1-4939-6674-5Subject(s): Materials Science | Measurement | Microscopy | Physical measurements | Spectroscopy | Biological Microscopy

List(s) this item appears in: New Arrivals : Display Books List from 12/02/2024-18/02/2024

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode	Item holds
Books	Central Library, IITB General Stacks	620.186/.187 Sca	Available		250880

Total holds: 0

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