ITC : international test conference : integration of test with design and manufacturing, Washignton, Sept. 1-3, 1987

Institute of Electrical and Electronics Engineers

ITC : international test conference : integration of test with design and manufacturing, Washignton, Sept. 1-3, 1987 - - New York IEEE, 1987 - xxxi,1151 p. 28 cm - .

0-8186-0798-X2



Electronic-Testing-Congresses

621.372:621.382 Ins:87

Powered by Koha