Cross-correlation measurement of low-frequency conductivity noise and role of invasive voltage probes in weak localization measurements (R)

By: Jain, Aditya KumarContributor(s): Das Gupta, Kantimay [Supervisor] | Indian Institute of Technology Bombay. Department of PhysicsMaterial type: TextTextLanguage: English Publication details: Mumbai IIT 2019Description: xviii,113 p. 30 cmSubject(s): Theses and Dissertations | Electronic noise | Electronic noise measurements | Thermal noise | Voltage | Power spectral densityDissertation note: Thesis Ph.D. Indian Institute of Technology Bombay. Department of Physics 2019
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Holdings
Item type Current library Collection Call number Status Date due Barcode Item holds
Theses and Dissertations Theses and Dissertations Central Library, IITB
Pamphlet Section (Theses, Standards, Reports)
Reference 534.83 Jai Not for loan 247713
Total holds: 0

Thesis Ph.D. Indian Institute of Technology Bombay. Department of Physics
2019

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