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Cross-correlation measurement of low-frequency conductivity noise and role of invasive voltage probes in weak localization measurements (R)

Jain, Aditya Kumar

Cross-correlation measurement of low-frequency conductivity noise and role of invasive voltage probes in weak localization measurements (R) - Mumbai IIT 2019 - xviii,113 p. 30 cm

Thesis

Subjects--Topical Terms:
Theses and Dissertations
Electronic noise
Electronic noise measurements
Thermal noise
Voltage
Power spectral density

Universal Decimal Class. No.: 534.83 / Jai

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