Sub-Bandgap impact ionization in Si NIPIN selector diode and its applications (R)

By: Das, Bhaskar [Author]Contributor(s): Ganguly, Udayan [Supervisor] | Lodha, Saurabh [Supervisor] | Indian Institute of Technology Bombay. Department of Electrical EngineeringMaterial type: TextTextLanguage: English Publication details: Mumbai IIT 2018Description: xxiii,143 p. 30 cmSubject(s): Theses and Dissertations | Semiconductor storage devices | Random Access Memory (RAM) | Semiconductor devicesDissertation note: Indian Institute of Technology Bombay. Department of Electrical Engineering
List(s) this item appears in: Display List 27/01/2020-02/02/2020
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Holdings
Item type Current library Call number Status Date due Barcode Item holds
Theses and Dissertations Theses and Dissertations Central Library, IITB
Pamphlet Section (Theses, Standards, Reports) 		043:621.382:681.3.07 Das Not for loan 246543
Total holds: 0

Indian Institute of Technology Bombay. Department of Electrical Engineering

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