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Sub-Bandgap impact ionization in Si NIPIN selector diode and its applications (R)

Das, Bhaskar

Sub-Bandgap impact ionization in Si NIPIN selector diode and its applications (R) - Mumbai IIT 2018 - xxiii,143 p. 30 cm

Subjects--Topical Terms:
Theses and Dissertations
Semiconductor storage devices
Random Access Memory (RAM)
Semiconductor devices

Universal Decimal Class. No.: 043:621.382:681.3.07 / Das

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