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International test conference : quality productivity profit : digest of papers, Philadelphia, Nov. 15-18, 1982

Institute of Electrical and Electronics Engineers

International test conference : quality productivity profit : digest of papers, Philadelphia, Nov. 15-18, 1982 - - New York IEEE, 1982 - xxiii, 672 p. 28 cm - .

ISBN: 1

Subjects--Topical Terms:

Electronic-Testing-Congresses

Universal Decimal Class. No.: 621.372:621.382 Ins:82

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