Point defects in semiconductors : experrmental aspects

By: Bourgoin, JContributor(s): Lannoo, M | Language: English Series: Publication details: Berlin ; Springer-Verlag, ; 1983Edition: Description: pt.2; 23 cmISBN: 3Subject(s): | Semiconductors-Defects | Point defects
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Holdings
Item type Current library Call number Status Notes Date due Barcode Item holds
Books Books Central Library, IITB
537.311.33 Lan-2 Available G19B34 121605
Total holds: 0

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