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Point defects in semiconductors : experrmental aspects

Bourgoin, J.

Point defects in semiconductors : experrmental aspects - - Berlin Springer-Verlag, 1983 - pt.2 23 cm - .

ISBN: 3

Subjects--Topical Terms:

Semiconductors-Defects
Point defects

Universal Decimal Class. No.: 537.311.33 Lan-2

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