Proceedings of the transistor reliability symposium, New York, Sept. 17-18, 1956

By: Contributor(s): Language: English Series: Publication details: New York ; New York University Press, ; 1958Edition: Description: 128 p; 27 cmISBN: 1Subject(s): | Transistor-Congresses
Star ratings
    Average rating: 0.0 (0 votes)
Holdings
Item type Current library Call number Status Notes Date due Barcode Item holds
Books Books Central Library, IITB
621.382.3 Pro:56 Available G37A20 10015
Total holds: 0

There are no comments on this title.

to post a comment.
Share

Powered by Koha