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Proceedings of the transistor reliability symposium, New York, Sept. 17-18, 1956

Proceedings of the transistor reliability symposium, New York, Sept. 17-18, 1956 - - New York New York University Press, 1958 - 128 p. 27 cm - .

ISBN: 1

Subjects--Topical Terms:

Transistor-Congresses

Universal Decimal Class. No.: 621.382.3 Pro:56

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