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Computer aided simulation of MOS device degradation (R)

Subbaraman, Shaila

Computer aided simulation of MOS device degradation (R) - Mumbai IIT 1998 - xiii,175 p. 28 cm

Thesis

Subjects--Topical Terms:
Theses and Dissertations
Metal oxide semiconductors--Computer simulation

Universal Decimal Class. No.: 043:621.382:620.1:681.3 / Sub

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