Curvature measurement and stresses in electronic devices due to strained silicon nitride layer (R)

By: Bharani, RahilContributor(s): Pant, Prita and Dusane, R.OLanguage: English Series: Publication details: Mumbai ; IIT ; 2013Edition: Description: vii,76 p; 30 cmISBN: Subject(s): Pant, Prita and Dusane, R.O | Theses and Dissertations | Silicon nitride coatings , Strains and stresses-Measurement , Curvature-Measurement
Star ratings
    Average rating: 0.0 (0 votes)
Holdings
Item type Current library Call number Status Notes Date due Barcode Item holds
Theses and Dissertations Theses and Dissertations Central Library, IITB
043:669.782:621.382Bha Not for loan D06B16 233669
Total holds: 0

There are no comments on this title.

to post a comment.
Share

Powered by Koha