VLSI testing : computer based test generation techniques (R)

By: Ravindran, RContributor(s): Isaac,J.RLanguage: English Series: Publication details: Bombay ; IIT ; 1984Edition: Description: 129 p; 30 cmISBN: Subject(s): Isaac,J.R | Theses and Dissertations | VLSI circuits
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Holdings
Item type Current library Call number Status Notes Date due Barcode Item holds
Theses and Dissertations Theses and Dissertations Central Library, IITB
043:621.372:621.382Rav Not for loan D02B06 128394
Total holds: 0

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