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VLSI testing : computer based test generation techniques (R)

Ravindran, R.

VLSI testing : computer based test generation techniques (R) - - Bombay IIT 1984 - 129 p. 30 cm - .

ISBN:

Subjects--Topical Terms:
Isaac,J.R.
Theses and Dissertations
VLSI circuits

Universal Decimal Class. No.: 043:621.372:621.382Rav

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