Thin film reference materials development final redport for CRADA CN-1364

Contributor(s): Language: English Series: NIST SP 400 - 100 : 1998Publication details: Gaithersburg ; National Institute of Standard and Technology ; 1998Edition: Description: 42 p; 28 cmISBN: Subject(s): | Calibration, Ellipsometry, Metrology, Reference materials, Silicon dioxideOnline resources: Click here to access online
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Holdings
Item type Current library Call number Status Date due Barcode Item holds
Pamphlets Standards Reports Pamphlets Standards Reports Central Library, IITB
LNIST SP 400 - 100 : 1998 Not for loan A64449
Total holds: 0

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