Antireflecting-Chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems (SRM)

Contributor(s): Language: English Series: NIST SP 260 - 129 : 1997Publication details: Gaithersburg ; National Institute of Standards and Technology ; 1997Edition: Description: 35 p; 28 cmISBN: Subject(s): | Online resources: Click here to access online
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Item type Current library Call number Status Date due Barcode Item holds
Pamphlets Standards Reports Pamphlets Standards Reports Central Library, IITB
LNIST SP 260 - 129 : 1997 Not for loan A63899
Total holds: 0

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