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Antireflecting-Chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems (SRM)

Antireflecting-Chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems (SRM) - - Gaithersburg National Institute of Standards and Technology 1997 - 35 p. 28 cm - NIST SP 260 - 129 : 1997 .

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Universal Decimal Class. No.: LNIST SP 260 - 129 : 1997

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