Characterization of crystal growth decects by x-ray methods / edited by Brian K. Tanner and D. Keith Bowen

By: Contributor(s): Language: English Series: Publication details: New York ; Plenum Press, ; 1980Edition: Description: xxvi,589 p; 25 cmISBN: 0-306-40628-41Subject(s): | Crystals-Defects-Congresses | X-ray crystallography-Congresses
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Holdings
Item type Current library Call number Status Notes Date due Barcode Item holds
Books Books Central Library, IITB
548.4 Cha:79 Available G25B06 119096
Total holds: 0

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