Characterization of crystal growth decects by x-ray methods / edited by Brian K. Tanner and D. Keith Bowen
Language: English Series: Publication details: New York ; Plenum Press, ; 1980Edition: Description: xxvi,589 p; 25 cmISBN: 0-306-40628-41Subject(s): | Crystals-Defects-Congresses | X-ray crystallography-CongressesItem type | Current library | Call number | Status | Notes | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|
Books | Central Library, IITB | 548.4 Cha:79 | Available | G25B06 | 119096 |
Total holds: 0
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