Characterization of crystal growth decects by x-ray methods / edited by Brian K. Tanner and D. Keith Bowen
Characterization of crystal growth decects by x-ray methods / edited by Brian K. Tanner and D. Keith Bowen - - New York Plenum Press, 1980 - xxvi,589 p. 25 cm - .
0-306-40628-41
Crystals-Defects-Congresses
X-ray crystallography-Congresses
548.4 Cha:79